Color figure captions

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jaseg 2025-07-15 23:12:33 +02:00
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@ -669,10 +669,11 @@ turn-on knee of the sampling diodes.
\end{subfigure}
\end{center}
\vspace*{-5mm}
\caption{Spectrum measurements and reconstructed time domain edge shape of the stimulus pulse measured at the
mesh interface for each of the four driver ICs. Vertical scale shows arbitrary units. Spectrum plots include a
$\frac{1}{f}$ curve indicating the frequency components of an ideal infinite-bandwidth square wave. Horizontal gray
lines in the time domain plots indicate thresholds used for rise time calculation.}
\caption{\color{highlightred}Spectrum measurements and reconstructed time domain edge shape of the stimulus pulse
measured at the mesh interface for each of the four driver ICs, captured using a spectrum analyzer. Vertical
scale shows arbitrary units. Spectrum plots include a $\frac{1}{f}$ curve indicating the frequency components of
an ideal infinite-bandwidth square wave. Horizontal gray lines in the time domain plots indicate thresholds used
for rise time calculation.}
\label{fig_spec_risetime}
\end{figure}
@ -865,9 +866,10 @@ switching.
\includegraphics[width=.8\textwidth]{fig_mesh_length.pdf}
\vspace*{-10mm}
\end{center}
\caption{TDR responses captured using our design with each of four candidate pulse amplifier ICs and four test
meshes. The shown time range covers the primary reflection of the stimulus pulse's falling edge. The vertical
scale of the graphs is in Volts at the ADC. For clarity, only one channel of the differential response is shown.}
\caption{\color{highlightred}TDR responses captured by the microcontroller's internal ADCs with each of four
candidate pulse amplifier ICs and four test meshes. The shown time range covers the primary reflection of the
stimulus pulse's falling edge. The vertical scale of the graphs is in Volts at the ADC. For clarity, only one
channel of the differential response is shown.}
\label{fig_mesh_length}
\end{figure}
@ -982,7 +984,7 @@ indicates good performance of our design, and increases the detection efficiency
\label{fig_layout_identity_identity}
\end{subfigure}
\hfill
\caption{Similarity matrices of measurement series on intact meshes.}
\caption{\color{highlightgreen}Similarity matrices of measurement series on intact meshes.}
\label{fig_layout_identity}
\end{figure}
@ -1008,8 +1010,8 @@ indicates good performance of our design, and increases the detection efficiency
\includegraphics[width=\textwidth]{fig_covar_short_across_traces_p0.4.pdf}
\caption{Both traces shorted, p=\qty{0.4}{\milli\meter}. FNR 0.0\% at 0.1\% FPR, CER=0\%.}
\end{subfigure}
\caption{Similarity matrix of 10 intact and 10 modified meshes with two pitch sizes under two different attack
scenarios: An interrupted trace, and both mesh traces shorted.}
\caption{\color{highlightgreen}Similarity matrix of 10 intact and 10 modified meshes with two pitch sizes under two
different attack scenarios: An interrupted trace, and both mesh traces shorted.}
\label{fig_covar_basic_attacks}
\end{figure}
@ -1022,8 +1024,8 @@ location of the reflected pulse edge, leading to 0\% Crossover Error Rate.
\begin{figure}
\centering
\includegraphics[width=0.33\textwidth,trim=0 5mm 0 5mm]{fig_covar_short_within_0.3.pdf}
\caption{Similarity matrix of several mesh specimens that have one trace shorted to an adjacent location on the same
trace. Classification FNR 18\% at 0.1\% FPR, CER=17\%.}
\caption{\color{highlightgreen}Similarity matrix of several mesh specimens that have one trace shorted to an
adjacent location on the same trace. Classification FNR 18\% at 0.1\% FPR, CER=17\%.}
\label{fig_short_within}
\end{figure}
@ -1060,7 +1062,7 @@ and others never detected.
\caption{Baseline vs. experiment specimens with no attack.}
\label{fig_covar_adv_baseline}
\end{subfigure}
\caption{Classifier performance under advanced attack scenarios.}
\caption{\color{highlightgreen}Classifier performance under advanced attack scenarios.}
\label{fig_covar_adv_attack}
%too much: fig_covar_soldering_p0.3_minmax.pdf
%too much: fig_covar_antenna_wire_30mm_p0.3_minmax.pdf
@ -1095,7 +1097,8 @@ cases at 0\% FNR, with a maximum of 9.6\% FNR at 0.1\% FNR in the soldered wire
\label{fig_covar_patch_attack_scatter}
\end{subfigure}
\hfill
\caption{Classifier performance under a patching attack that bridges a short gap within a mesh trace using wire.}
\caption{\color{highlightgreen}Classifier performance under a patching attack that bridges a short gap within a mesh
trace using wire.}
\label{fig_covar_patch_attack}
\end{figure}
@ -1130,9 +1133,9 @@ in one place, while the experiment distribution shifts.
\vspace*{2mm}
\label{fig_drill_mod_shape_pic}
\end{subfigure}
\caption{The mesh response under a manipulation attack patching across a drill location for a
\qty{300}{\micro\meter} drill. The mesh pitch is \qty{300}{\micro\meter}. B-spline smoothing was applied for
readability.}
\caption{\color{highlightred}The mesh response under a manipulation attack patching across a drill location for a
\qty{300}{\micro\meter} drill, as captured by the microcontroller's ADCs. The mesh pitch is
\qty{300}{\micro\meter}. B-spline smoothing was applied for readability.}
\label{fig_drill_mod_shape}
\end{figure}
@ -1160,8 +1163,8 @@ at 0.1\%.
\caption{\emph{maximum} classifier variant. FNR 51.1\% at 0.1\% FPR, CER=15\%.}
\label{fig_patch_large_scale_minmax}
\end{subfigure}
\caption{Classification performance in a larger-scale experiment using 10 measurements each of 7 samples with
traces patched through micro-soldering.}
\caption{\color{highlightgreen}Classification performance in a larger-scale experiment using 10 measurements each of
7 samples with traces patched through micro-soldering.}
\label{fig_patch_large_scale}
\end{figure}
@ -1207,14 +1210,14 @@ domain based on a temperature measurement.
\caption{Mesh heated (\qty{70}{\degree C}). FNR 0.6\% at 0.1\% FPR, CER=0\%.}
\label{fig_env_effects_heat}
\end{subfigure}
\caption{Classification results of the same mesh under various environmental factors.}
\caption{\color{highlightgreen}Classification results of the same mesh under various environmental factors.}
\label{fig_env_effects}
\end{figure}
\begin{figure}
\centering
\includegraphics[width=1.0\textwidth]{fig_tempco_edited.pdf}
\caption{The effect of heating on a time-domain trace. One of 12 channels shown. Gray: Raw data. Black: Relative
\caption{\color{highlightgreen}The effect of heating on a time-domain trace. One of 12 channels shown. Gray: Raw data. Black: Relative
difference between hot and cool cases.}
\label{fig_tempco_time}
\end{figure}
@ -1233,9 +1236,9 @@ classification performance remaining approximately constant at 69.0\% FNR at 0.1
% NOTE: not actually "tridelta" data, I'm just too lazy to rename these and fix up the notebook.
\includegraphics[width=0.6\textwidth]{fig_covar_patch_repeat_tridelta_all_the_data_p0.3.pdf}
\hspace*{2mm}
\caption{Classifier similarity scores of measurements in different environments, 10 measurements each. For scale,
measurements from Figure~\ref{fig_patch_large_scale} are included on the bottom/right. FNR 69.0\% at 0.1\% FPR,
CER=20\%.}
\caption{\color{highlightgreen}Classifier similarity scores of measurements in different environments, 10
measurements each. For scale, measurements from Figure~\ref{fig_patch_large_scale} are included on the
bottom/right. FNR 69.0\% at 0.1\% FPR, CER=20\%.}
\label{fig_env_covar}
\end{figure}
@ -1328,31 +1331,4 @@ LaTeX source for this paper, all hardware design files, and firmware and analysi
\FloatBarrier
\printbibliography[heading=bibintoc]
\appendix
\section{Additional photos}
\label{appendix_photos}
\begin{figure}[h!]
\centering
\begin{subfigure}{0.45\textwidth}
\centering
\includegraphics[width=0.8\textwidth]{pic_short_2_small.jpg}
\label{fig_pic_specimens_short}
\caption{Short circuit test specimen}
\end{subfigure}
\begin{subfigure}{0.45\textwidth}
\centering
\includegraphics[width=0.8\textwidth]{pic_cut_1_small.jpg}
\label{fig_pic_specimens_open}
\caption{Cut trace test specimen}
\end{subfigure}
\caption{Photos of the short circuit and cut trace test specimens. In the specimen shown on the left, in each of the
three marked locations, both traces of the mesh were exposed. To measure short circuit response, the traces were
shorted in one of the locations using a soldering iron. In the specimen shown on the right, one trace was
exposed and cut in the marked location. To measure baseline values, the test specimen shown on the right was
used with the trace temporarily repaired.}
\label{fig_pic_specimens}
\end{figure}
\end{document}