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Move some photos to the appendix

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@ -930,26 +930,6 @@ by applying the same electronic CAD/electromagnetic simulation co-design approac
\subsection{Tamper tests}
\begin{figure}
\centering
\begin{subfigure}{0.45\textwidth}
\centering
\includegraphics[width=0.8\textwidth]{pic_short_2_small.jpg}
\ref{fig_pic_speciments_short}
\caption{Short circuit test specimen}
\end{subfigure}
\begin{subfigure}{0.45\textwidth}
\centering
\includegraphics[width=0.8\textwidth]{pic_cut_1_small.jpg}
\ref{fig_pic_speciments_open}
\caption{Cut trace test specimen}
\end{subfigure}
\caption{Photos of the short circuit and cut trace test specimens. To measure short circuit response, one of the
three marked locations on the test specimen was shorted using a soldering iron. To measure baseline values, the
short circuit specimen was used without placing a short.}
\label{fig_pic_specimens}
\end{figure}
After validating our prototype's electrical performance as well as our mesh specimen designs in the previous sections,
we performed a series of experiments where we performed tampering attempts on a mesh specimen while monitoring it using
our TDR prototype, capturing responses both before and after tampering. We performed two sets of experiments.
@ -970,11 +950,11 @@ our TDR prototype, capturing responses both before and after tampering. We perfo
\end{figure}
In our first experiment, we tested both short and open circuit conditions. We tested a short circuit between the two
mesh traces in each of three locations as shown in Figure\ \ref{fig_pic_specimens}, as well as a cut trace halfway
through the mesh. Figure\ \ref{fig_manip_shape} shows the result of our experiment. The graphs show a clear response of
our monitoring circuit to all four tampering scenarios. Short and open circuit conditions can clearly be distinguished
from each other, and in all cases, the fault location can be determined with sub-nanosecond precision, corresponding to
several centimeters in distance along the mesh.
mesh traces in three locations as well as a cut trace halfway through the mesh. Figure\ \ref{fig_pic_specimens} in
Appendix\ \ref{appendix_photos} shows photos of our test specimen. Figure\ \ref{fig_manip_shape} shows the result of our
experiment. The graphs show a clear response of our monitoring circuit to all four tampering scenarios. Short and open
circuit conditions can clearly be distinguished from each other, and in all cases, the fault location can be determined
with sub-nanosecond precision, corresponding to several centimeters in distance along the mesh.
\subsubsection{Probing by Oscilloscope Probe}
@ -1121,7 +1101,32 @@ LaTeX source for this paper, all hardware design files, and firmware and analysi
\center{Note: URL elided for peer review}
% \center{\url{https://git.jaseg.de/ihsm-sampling-mesh-monitor-hw.git}}
\FloatBarrier
\printbibliography[heading=bibintoc]
\appendix
\section{Additional photos}
\label{appendix_photos}
\begin{figure}[h!]
\centering
\begin{subfigure}{0.45\textwidth}
\centering
\includegraphics[width=0.8\textwidth]{pic_short_2_small.jpg}
\label{fig_pic_speciments_short}
\caption{Short circuit test specimen}
\end{subfigure}
\begin{subfigure}{0.45\textwidth}
\centering
\includegraphics[width=0.8\textwidth]{pic_cut_1_small.jpg}
\label{fig_pic_speciments_open}
\caption{Cut trace test specimen}
\end{subfigure}
\caption{Photos of the short circuit and cut trace test specimens. To measure short circuit response, one of the
three marked locations on the test specimen was shorted using a soldering iron. To measure baseline values, the
short circuit specimen was used without placing a short.}
\label{fig_pic_specimens}
\end{figure}
\end{document}