From 176d9ac4f80fd8e0dab3c7904575e47e395ec4a7 Mon Sep 17 00:00:00 2001
From: jaseg <git@jaseg.de>
Date: Thu, 17 Apr 2025 18:21:37 +0200
Subject: [PATCH] Analysis workflow WIP

---
 paper.tex | 13 +++++++++++++
 1 file changed, 13 insertions(+)

diff --git a/paper.tex b/paper.tex
index 0978d58..07d5a68 100644
--- a/paper.tex
+++ b/paper.tex
@@ -133,6 +133,19 @@ Disassembly detection method
 Solderability
 
 
+\subsection{Analysis Workflow}
+
+Device Photo
+Device x-ray
+Device CT
+Disassembly
+Optical inspection
+Board x-ray
+Board CT
+Electrical tests
+Tampering tests
+Chemical tests
+
 \paragraph{Mesh monitoring}
 
 \section{Overview of Selected Samples}